Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions

The article deals with issues to be tackled when performing experiments with low voltage
devices under real switching conditions and subsequently discusses various phenomena in an experimental
device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic
methods. The second part describes some phenomena encountered during switching process under real
switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only
important for experimental study itself but also form necessary input data for numerical models and
their validation.